发明名称 FIELD EFFECT TRANSISTOR AND SEMICONDUCTOR STRUCTURE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A field effect transistor, semiconductor structure and method for fabricating the same are provided to increase threshold voltage in the neighborhood of a corner of insulating region of a semiconductor structure such as FET, to simplify the process for increasing threshold voltage, to simply and reliably perform modeling, to increase voltage tolerance and to increase tolerance about electrical over stress and ESD. CONSTITUTION: A field effect transistor comprises: a source and drain region(26,28) formed in a substrate(20); a channel region(24) formed between the source region and drain region; an insulating region(22) being adjacent to the source region, channel region and drain region in the substrate; a gate(30) formed on the channel region and having gate dopants separated from the channel region(24) by a gate insulator(32), wherein the gate comprises a region, where the gate dopants are depleted, overlapping with the channel region(24) and insulating region(22).
申请公布号 KR20000022709(A) 申请公布日期 2000.04.25
申请号 KR19990033261 申请日期 1999.08.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION. 发明人 BROWN JEFFREY S.;GAUDY ROBERT J. 2;BOLDMAN STEVEN H.
分类号 H01L29/78;H01L21/28;H01L21/336;H01L21/762;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/78
代理机构 代理人
主权项
地址