发明名称 |
Elevated local interconnect and contact structure |
摘要 |
A semiconductor process in which a local interconnect, formed above a first transistor level, is connected to the first transistor level through a self-aligned and low resistivity contact structure. A semiconductor substrate is provided and a first transistor level formed on an upper surface of the semiconductor substrate. The first transistor level includes a first transistor. A local interconnect is then formed over the first transistor level. The local interconnect is vertically displaced above the first transistor level such that the local interconnect may traverse a gate of the first transistor without contacting the gate. A contact structure is then formed to connect the first source/drain structure of the first transistor with the local interconnect. The contact structure includes a first self-aligned silicide at an interface between the contact structure and the first source/drain region and further includes a second self-aligned silicide at an interface between the contact structure and the local interconnect.
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申请公布号 |
US6054385(A) |
申请公布日期 |
2000.04.25 |
申请号 |
US19970792086 |
申请日期 |
1997.01.31 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
GARDNER, MARK I.;HAUSE, FRED |
分类号 |
H01L21/768;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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