发明名称 SOI TRANSISTOR CIRCUITRY EMPLOYING SOI TRANSISTORS AND METHOD OF MANUFACTURE THEREOF.
摘要 PURPOSE: A method is provided for semiconductor on insulator transistor, memory and other DRAM circuitry and arrays, transistor gate arrays, and methods of fabricating such constructions. CONSTITUTION: The semiconductor on insulator transistor includes insulator layer, semiconductor material layer, two elevationally spaced source/drain diffusion region, and reansistor gate. A semiconductor on insulator transistor includes: a) an insulator layer; b) a layer of semiconductor material over the insulator layer; c) a transistor gate provided within the semiconductor material layer; and d) an outer elevation source/drain diffusion region and an inner elevation diffusion region provided within the semiconductor material layer in operable proximity to the transistor gate. In another aspect, DRAM circuitry includes a plurality of memory cells not requiring sequential access, at least a portion of the plurality having more than two memory cells for a single bit line contact. In still another aspect, a DRAM array of memory cells comprises a plurality of word lines, source regions, drain regions, bit lines in electrical connection with the drain regions, and storage capacitors in electrical connection with the source regions; at least two drain regions of different memory cells being interconnected with one another beneath one of the word lines.
申请公布号 KR20000022056(A) 申请公布日期 2000.04.25
申请号 KR19987010459 申请日期 1998.12.21
申请人 MICRON TECHNOLOGY, INC. 发明人 PRALL, KIRK, D
分类号 H01L21/8242;H01L21/336;H01L21/84;H01L27/108;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/8242
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