发明名称 SEMICONDUCTOR SUBSTRATE AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A semiconductor substrate and a methode for forming the same are provided to reduce a thickness of a nonporous single crystal layer by performing a heat treatment process under an atmosphere not containing a source gas of the nonporous signal crystal layer. CONSTITUTION: A methode for forming a semiconductor substrate comprises the step of performing a heat treatment process for a porous silicon layer(11) under an atmosphere not containing a source gas of a nonporous signal crystal layer(6). In the methode, a condition of the heat treatment process is defined with (a haze value of the porous silicon layer surface after performing the heat treatment process)/(a haze value of the porous silicon layer surface before performing the heat treatment process). A semiconductor substrate is formed with the methode.
申请公布号 KR20000022995(A) 申请公布日期 2000.04.25
申请号 KR19990038228 申请日期 1999.09.03
申请人 CANON KABUSHIKI KAISHA 发明人 SATO NOBUHIKO
分类号 H01L21/20;H01L21/205;(IPC1-7):H01L21/20 主分类号 H01L21/20
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