发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to simplify processes by forming a channel area having different threshold voltages, respectively, by performing an ion injection for controlling threshold voltage after forming a buffer dielectric layer, each having different thickness on a semiconductor substrate. CONSTITUTION: A method for manufacturing a semiconductor device includes a first through third steps. The first step is to form a first buffer dielectric layer(33) on the surface of a first active area(B1) and a second buffer dielectric layer(32) having thicker than the first buffer dielectric layer on the surface of a second active area(B2) after defining the first active area and the second active area on a semiconductor substrate(31). The second step is to perform an ion injection for controlling a threshold voltage on the first and second buffer dielectric layers. The third step is to delete the first and the second buffer dielectric layers.
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申请公布号 |
KR20000021390(A) |
申请公布日期 |
2000.04.25 |
申请号 |
KR19980040428 |
申请日期 |
1998.09.29 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
JEONG, JONG WAN;KIM, JAE YOUNG |
分类号 |
H01L21/822;(IPC1-7):H01L21/822 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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