发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to simplify processes by forming a channel area having different threshold voltages, respectively, by performing an ion injection for controlling threshold voltage after forming a buffer dielectric layer, each having different thickness on a semiconductor substrate. CONSTITUTION: A method for manufacturing a semiconductor device includes a first through third steps. The first step is to form a first buffer dielectric layer(33) on the surface of a first active area(B1) and a second buffer dielectric layer(32) having thicker than the first buffer dielectric layer on the surface of a second active area(B2) after defining the first active area and the second active area on a semiconductor substrate(31). The second step is to perform an ion injection for controlling a threshold voltage on the first and second buffer dielectric layers. The third step is to delete the first and the second buffer dielectric layers.
申请公布号 KR20000021390(A) 申请公布日期 2000.04.25
申请号 KR19980040428 申请日期 1998.09.29
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 JEONG, JONG WAN;KIM, JAE YOUNG
分类号 H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L21/822
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