发明名称 GRINDING DEVICE AND PAD
摘要 PROBLEM TO BE SOLVED: To uniformly flatten the whole surface of a semiconductive substrate in a grinding device or pad to be used in a mechanical flattening process, for smoothing the surface of an insulating layer or metallic wiring formed on the semiconductive substrate by grinding. SOLUTION: A semiconductive substrate is fixed to a grinding head, and the substrate is pushed against by an abrasive layer having a micro-rubber A hardness of 70 deg. or more and fixed to an abrasive surface plate via a cushion layer having a volume modulus of 600 kg/cm2 or more and a compression elastic modulus of 10 kg/cm2 or more and 140 kg/cm2 or less. The substrate is ground by rotating the head or the surface plate or both of them in the condition where the warping or irregularities of the substrate itself is absorbed into the cushion layer.
申请公布号 JP2000117619(A) 申请公布日期 2000.04.25
申请号 JP19980290477 申请日期 1998.10.13
申请人 TORAY IND INC 发明人 JIYOU KUNITAKA;OKA TETSUO
分类号 B24B1/00;B24B37/20;B24B37/22;B24B37/24;H01L21/304 主分类号 B24B1/00
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