发明名称 NON VOLATILE SEMICONDUCTOR MEMORY DEVICE, VERIFY METHOD THEREOF AND READ METHOD THEREOF
摘要 PURPOSE: A non volatile semiconductor memory device is provided to prevent an increment of a circuit scale when storing multi-value data to a memory cell. CONSTITUTION: In a non volatile semiconductor memory device, a plurality of latchcircuits(LQ1,LQ2) simultaneously latch write data at writing, and are set with predetermined data when data is sufficiently written at verifying. Read data is set at the latch circuits of the plurality at reading. A write controller(23) sets bit line voltages according to the data latched in the latch circuits at writing. A verify controller(23) sets a word line voltage according to a distribution state of a threshold voltage at verifying, and secures the latch circuits according to whether a threshold voltage of a memory cell exceeds a voltage applied to the word line. The verify controller(23) controls such that predetermined data is set in the latch circuits when data is sufficiently written at verifying. A read controller(23) sets a word line voltage according to a distribution state of a threshold voltage at reading, and secures the latch circuits according to whether a threshold voltage of a memory cell exceeds a voltage applied to the word line.
申请公布号 KR20000023177(A) 申请公布日期 2000.04.25
申请号 KR19990039505 申请日期 1999.09.15
申请人 SONY CORPORATION 发明人 NOBUKATA HIROMI
分类号 G11C16/02;G11C11/56;G11C16/04;G11C16/12;G11C16/34;(IPC1-7):G11C16/02 主分类号 G11C16/02
代理机构 代理人
主权项
地址