发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method is provided to realize an easy patterning and obtain a high quality of a semiconductor device by performing etching to open through holes in a state of a low aspect ratio. CONSTITUTION: A first insulation membrane(9) is formed on a lower layer having an electric conductor layer(17). First openings are formed in the first insulation membrane(9) to expose a portion of the electric conductor layer(17). A second insulation membrane(12) is formed while the first openings are filled with the second insulation membrane(12). A mask is formed on the second insulation membrane(12) to have an openings in the same size as the first openings in regions corresponding to the first openings. A wiring layer electrically connected to the electric conductor layer(17) is formed.
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申请公布号 |
KR20000022961(A) |
申请公布日期 |
2000.04.25 |
申请号 |
KR19990037931 |
申请日期 |
1999.09.07 |
申请人 |
SHARP CORPORATION |
发明人 |
TAKENAKA NOBUYUKI |
分类号 |
H01L21/3205;H01L21/312;H01L21/316;H01L21/768;H01L23/522;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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