发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method is provided to realize an easy patterning and obtain a high quality of a semiconductor device by performing etching to open through holes in a state of a low aspect ratio. CONSTITUTION: A first insulation membrane(9) is formed on a lower layer having an electric conductor layer(17). First openings are formed in the first insulation membrane(9) to expose a portion of the electric conductor layer(17). A second insulation membrane(12) is formed while the first openings are filled with the second insulation membrane(12). A mask is formed on the second insulation membrane(12) to have an openings in the same size as the first openings in regions corresponding to the first openings. A wiring layer electrically connected to the electric conductor layer(17) is formed.
申请公布号 KR20000022961(A) 申请公布日期 2000.04.25
申请号 KR19990037931 申请日期 1999.09.07
申请人 SHARP CORPORATION 发明人 TAKENAKA NOBUYUKI
分类号 H01L21/3205;H01L21/312;H01L21/316;H01L21/768;H01L23/522;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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