DEVICE FOR TESTING SEMICONDUCTOR

摘要

PURPOSE: A device is provided to reduce costs of contactor and perform an exchange of the contactor with a low cost in maintenance since a single layer of the contactor can be realized. CONSTITUTION: A contactor(11) has a contact part(12) and an insulation board(13). The contact part(12) is constructed with a conductive metal membrane and an insulation board(13) is formed with a resin board in a single layer. A wiring board(15A) is formed with a multi-wiring board structure. An internal contact electrode(17) is formed on an upper surface on which the wiring board(15A) and the contactor(11) are formed. An external contact electrode(18) is formed on a lower surface opposite with the upper surface.