发明名称 |
METHOD OF MANUFACTURING THIN FILM TRANSISTOR |
摘要 |
PURPOSE: A method of manufacturing a thin film transistor is provided to improve yield by preventing defects caused by etching remainder like an electrode layer on a gate insulation layer in forming source/drain electrodes. CONSTITUTION: A method of manufacturing a thin film transistor comprises the steps of: forming a gate on a substrate; sequentially forming a gate insulation layer, an active layer, an ohmic contact layer and an electrode layer to cover the gate on the substrate; patterning the electrode layer, the ohmic contact layer and the active layer of which the portion corresponding to the gate remains to expose the gate insulation layer; and eliminating etching remainder on the gate insulation layer while forming source/drain electrodes by patterning the portion corresponding to the gate of the electrode layer by using the photoresist covering both sides of the ohmic contact layer of the electrode layer.
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申请公布号 |
KR20000021735(A) |
申请公布日期 |
2000.04.25 |
申请号 |
KR19980040984 |
申请日期 |
1998.09.30 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KANG, SEONG GU;JEONG, JONG PIL |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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