发明名称 METHOD OF MANUFACTURING THIN FILM TRANSISTOR
摘要 PURPOSE: A method of manufacturing a thin film transistor is provided to improve yield by preventing defects caused by etching remainder like an electrode layer on a gate insulation layer in forming source/drain electrodes. CONSTITUTION: A method of manufacturing a thin film transistor comprises the steps of: forming a gate on a substrate; sequentially forming a gate insulation layer, an active layer, an ohmic contact layer and an electrode layer to cover the gate on the substrate; patterning the electrode layer, the ohmic contact layer and the active layer of which the portion corresponding to the gate remains to expose the gate insulation layer; and eliminating etching remainder on the gate insulation layer while forming source/drain electrodes by patterning the portion corresponding to the gate of the electrode layer by using the photoresist covering both sides of the ohmic contact layer of the electrode layer.
申请公布号 KR20000021735(A) 申请公布日期 2000.04.25
申请号 KR19980040984 申请日期 1998.09.30
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KANG, SEONG GU;JEONG, JONG PIL
分类号 H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L29/786
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