| 摘要 |
PURPOSE: A semiconductor integrated circuit and a test method thereof are provided to separately test an operation of a digital circuit by inputting a test signal through a first external input terminal. CONSTITUTION: A digital circuit(C1) receives digital signals inputted from digital circuit input terminals(I0,I1,...,In), performs a decoding and a storage of digital signals, and outputs parallel digital signals(G0,G1,..,G7) with 8 bits in the time determined by a clock signal(CLK). An analog circuit(C2) receives parallel digital signals(G0,G1,..,G7) with 8 bits outputted from the digital circuit(C1), converts the received parallel digital signals(G0,G1,..,G7) into analog signals, and outputs analog signals through an analog circuit output terminal(P0). The analog circuit(C2) has an analog signal processing unit(D0) for converting parallel digital signals(G0,G1,..,G7) into analog signals and outputs analog signals in the time determined by the clock signal(CLK) and a parallel/serial converting block(D1) for converting parallel digital signals(G0,G1,..,G7) into serial digital signals according to an enable signal(CVEN) and the clocks signal(CLK).
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