发明名称 Parallel plate electrode plasma reactor having an inductive antenna and adjustable radial distribution of plasma ion density
摘要 There is disclosed a plasma reactor for processing a semiconductor workpiece such as a wafer, including a chamber having an overhead ceiling with a three-dimensional shape such as a hemisphere or dome. The reactor further includes an inductive antenna over the ceiling which may be conformal or nonconformal in shape with the ceiling. The ceiling may be a semiconductor material so that it can function as both a window for the inductive field of the antenna as well as an electrode which can be grounded, or to which RF power may be applied or which may be allowed to float electrically. The reactor includes various features which allow the radial distribution of the plasma ion density across the wafer surface to be adjusted to an optimum distribution for processing uniformity across the wafer surface.
申请公布号 US6054013(A) 申请公布日期 2000.04.25
申请号 US19960740124 申请日期 1996.10.24
申请人 APPLIED MATERIALS, INC. 发明人 COLLINS, KENNETH;RICE, MICHAEL;TROW, JOHN;BUCHBERGER, DOUGLAS;ASKARINAM, ERIC;TSUI, JOSHUA;GROECHEL, DAVID;HUNG, RAYMOND
分类号 H05H1/46;C23C16/50;C23F4/00;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;H01L21/683;H05H1/00;(IPC1-7):H05H1/00 主分类号 H05H1/46
代理机构 代理人
主权项
地址