发明名称 |
SUBSTRATE VOLTAGE GENERATING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate voltage generating circuit and a semiconductor integrated circuit device for ensuring reliability by using a transistor whose gate oxidized film thickness is thin regardless of a high voltage boosting level. SOLUTION: A semiconductor integrated circuit device includes an oscillator for generating a clock signal and a charge pump circuit 100. The charge pump circuit 100 includes capacitative elements C1-C5 and an output transistor Q6. The capacitative element C2 boosts the voltage of a voltage boosting nose (node N2). A transistor Q9 cramps the voltage level of the node N2 to a constant value. The capacitative element C4 controls the gate voltage of the output transistor Q6. Voltages on transistors Q4 and Q7 and a capacitor C4 are reduced by using a transistor Q9, and the generation of hot carrier is suppressed.
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申请公布号 |
JP2000112547(A) |
申请公布日期 |
2000.04.21 |
申请号 |
JP19980282462 |
申请日期 |
1998.10.05 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
KOBAYASHI MASAKO;YAMAZAKI AKIRA |
分类号 |
H01L27/04;G05F3/16;G05F3/20;G11C11/407;G11C11/408;H01L21/822;(IPC1-7):G05F3/16 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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