| 摘要 |
PROBLEM TO BE SOLVED: To simplify a circuit constitution without using a shock sensor even while specifying the cause of failure by judging whether or not the cause of failure is vibration, etc., by comparing respective run-out amt. between the time of the fault occurrence and the time of normal operation by means of the shock sensor, etc., and to suppress the rise of costs and the enlargement of the scale of a device by reducing the number of parts. SOLUTION: A failure analyzing method for a magnetic disk device, by which the cause of the failure is discriminated when the failure occurs in the magnetic disk, involves a vibration and shock judgment process, by which the reference run-out amt. preliminarily recorded in a memory at the time of normal operation is compared with the measured run-out amt. measured at the time of the failure occurrence (Step 107), and if the measured run-out amt. us beyond an appropriate range set in accordance with the reference run-out amt. (Step 108/No.), it is judged that the cause of the failure is vibration or shock (Step 114).
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