发明名称 METHOD AND DEVICE FOR PROVIDING TEST LOOPS BETWEEN WRITE CHANNEL PROCESSOR AND READ CHANNEL PROCESSOR
摘要 PROBLEM TO BE SOLVED: To reduce the degree of complexity of test system by providing a digital test path and an analog test path in a system for writing a signal on a recording medium and reading the signal from the recording medium. SOLUTION: The output of a digital write path 406 is connected to a digital test loop provided with the combination of a simulation medium function generator 412 modeling the action of a physical medium with respect to a signal digitally and a noise generator 414 via a connection part 410. The output of the generator 414 is inputted to a multiplexer 420 selectively connecting either of the output of the read path from the digital test loop or the output of the read path from an ADC: 440. An analog test loop can be driven by reading out a write output 405 and by connecting it to an input via an attenuator 430 and a coupling capacitor. Moreover, a differentiator 436 is provided in order to model write and read actions.
申请公布号 JP2000113401(A) 申请公布日期 2000.04.21
申请号 JP19990278855 申请日期 1999.09.30
申请人 NEC CORP 发明人 ALFRED YOUNG;ZUU WAN PAN
分类号 G11B5/00;G11B20/10;G11B20/18;(IPC1-7):G11B5/00 主分类号 G11B5/00
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