发明名称 FLASH MEMORY AND FABRICATION METHOD
摘要 PROBLEM TO BE SOLVED: To obtain a flash memory which can be micromachined, can be increased in degree of integration, has a superior readout current characteristic, and can write data efficiently. SOLUTION: A split gate type flash memory is constituted in a virtual ground array using impurity diffusion layers 5a and 5d formed on a p-type semiconductor substrate 1 as bit and source lines. In the channel regions below floating gates 9 of the memory, p+ regions 6 containing a p-type impurity at the highest concentration are provided in portions adjacent to the drain-side impurity diffusion layers 5s and 5d, and p- regions 10 are provided in portions (below split gates) not covered with the floating gates.
申请公布号 JP2000114404(A) 申请公布日期 2000.04.21
申请号 JP19980286769 申请日期 1998.10.08
申请人 NEC CORP 发明人 KANAMORI KOJI
分类号 H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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