发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To realize a high-performance semiconductor device by providing a semiconductor film, having crystal properties that can practically be regarded as the single-crystal and assembling the circuit with a TFT, wherein the semiconductor film such as this is the active layer. SOLUTION: In this manufacture, following steps are provided in a first step, heat annealing is performed for the semiconductor film including germanium; in a next step, laser annealing is performed for the oxidized semiconductor film; in the next step, furnce annealing is performed for the semiconductor film after the laser annealing; and in the last step, oxidizing is performed for the semiconductor film including the crystal. The laser annealing is performed at energy density of 250-5,000 ml/cm2.
申请公布号 JP2000114172(A) 申请公布日期 2000.04.21
申请号 JP19980255494 申请日期 1998.09.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 OTANI HISASHI;TAKANO YOSHIE;YAMAZAKI SHUNPEI
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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