SPEED SIGNALING TEST FOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a test method of an IC capable of processing data at two or more different data rates. SOLUTION: A test method of an IC has a digital logical circuit 202 discriminated by respective data rates having a data prefix by different common mode voltage. Normally, the integrated circuit has one or more comparators for comparing an average signal voltage level with one or more reference voltages to decide the data rates. Different processing speeds of the digital logical circuit 202 can be tested by this method, and can be tested without making a special automatic testing device such as supporting the whole different possible voltage levels in response to the supporting different data rates.