SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a circuit system capable of reducing an area overhead by a scan circuit. SOLUTION: Scanning flip-flop circuits 11-1 to 11-j are arranged with every input terminal, output terminal and input/output terminal of respective modules 10 in an integrated circuit, and a module terminal is arranged through the flip-flop circuits 11-1 to 11-j. The respective modules 10 have shift scan circuits by connecting the flip-flop circuits 11-1 to 11-j in a chain shape at test mode time. A test of the integrated circuit is performed by shift-scanning the whole chip by connecting the shift scan circuits of the respective modules 10 in a chain shape.