发明名称 CMOS TRANSISTOR TYPE SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To reduce the variation of a TPD caused by the variation of the gate length of a MOS transistor constituting a CMOS transistor. SOLUTION: In a clocked CMOS transistor inverter, the capacitor electrodes 30a and 30b of a 1st capacitor part 30 connecting the source 12S (1st node 44) of a 2nd pMOS transistor 12 with a ground potential point 22 and the capacitor electrodes 32a and 32b of a 2nd capacitor part 32 connecting the source (3rd node 48) of a 1st nMOS transistor 14 with the ground potential point are made into rectangular patterns being parallel to each other. Also, they are formed together with a gate by polysilicon being the same material as the gate when the gate is formed.
申请公布号 JP2000114960(A) 申请公布日期 2000.04.21
申请号 JP19980281728 申请日期 1998.10.02
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 TOMOTA MASAFUMI
分类号 H01L27/092;H01L21/8238;H03K19/096;(IPC1-7):H03K19/096;H01L21/823 主分类号 H01L27/092
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