发明名称 MANUFACTURE FOR ROUGH POLYCRYSTALLINE SILICON IN-SITU- DOPED USING SINGLE-WAFER PROCESSING REACTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a manufacture for polycrystalline silicon for use in a semiconductor memory device memory device, which in fact solves and reduces defects and problems relating to a conventional manufacturing technique. SOLUTION: In this method, under specified temperature conditions and specified pressure conditions such that a core of a rough polycrystalline silicon is formed and grown, the rough polycrystalline silicon in-situ-doped within a sheet-fed chemical vapor-deposition chamber is vapor-deposited on a base, thereby producing a rough polycrystalline silicon. In this case, in the vapor deposition step, SiH4 flows into a single-wafer processing reaction apparatus 40, and substantially upon the inflow of SiH4, PH3 flows into the sheet-fed reactor 10, and next substantially upon an inflow of SiH4 and PH3, substantially and at the same time causing H2 to flow into the single-wafer processing reaction apparatus 10.
申请公布号 JP2000114250(A) 申请公布日期 2000.04.21
申请号 JP19990233881 申请日期 1999.08.20
申请人 TEXAS INSTR INC <TI> 发明人 TSU ROBERT Y;AOYAMA SHINTARO;ANDO TOSHIO
分类号 H01L21/31;C23C16/24;H01L21/02;(IPC1-7):H01L21/31 主分类号 H01L21/31
代理机构 代理人
主权项
地址