CHARACTERISTIC MEASURING DEVICE AND CHARACTERISTIC MEASURING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a characteristic measuring device capable of accurately measuring the dynamic characteristics of a high speed S/H(sample hold) circuit. SOLUTION: A desired input signal is produced with a pulse generator 12 and input in a characteristic measuring object S/H circuit 11. A PLL circuit 13 produces two sampling clock having the same period as the input signal and constant phase relation and outputs to the S/H circuit 11 and an S/H circuit 14. The sampling clock impressing in the S/H circuit 14 is to have a signal with a sampling period as short as possible. The signal sampled every time with the S/H circuit 14 is that in the vicinity of signal level measuring object position and so the signal sampled and held by the S/H circuit 14 gradually approaches the level of this measuring object. Eventually, measuring the signal level with a digital volt meter 15 in the same state as direct current component is enough.