| 摘要 |
PROBLEM TO BE SOLVED: To obtain a magnetic particle inspection apparatus by which a flaw can be separated with good accuracy from a noise component due to the accumulation of fluorescent magnetic particles by a method wherein a flaw candidate region is extracted from a differential image obtained by differentiating and processing an image imaged from the fluorescent magnetic particles and the flaw is specified on the basis of a flaw candidate region which appears in the binarized image of the imaged image. SOLUTION: A flaw-candidate-region extraction means 102 extracts a flaw candidate region from a differential image. An imaged-image binarization means 103 performs a binarization processing operation to an imaged image so as to generate a binarized image. A dotlike-noise-candidate-region extraction means 104 extracts a dotlike-noise- candidate region on the basis of the size and the shape of a region which appears in the binarized image generated by the imaged-image binarization means 104. In a dotlike-noise specification means 105, the flaw candidate region, on the difference image, which is extracted by the flaw-candidate-region extraction means 102 is compared with the dotlike noise candidate region, on the binarized image, which is extracted by the dotlike-noise-candidate extraction means 104 so as to specify a dotlike noise. A flaw extraction means 107 extracts a flaw from a difference region removed by a dotlike noise removal means 106.
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