Testing memory embedded in integrated circuit chip including microprocessor by generating memory test pattern based on object code of assembler test program

摘要

The method involves testing the microprocessor by applying a test pattern and evaluating the resultant output signal from the microprocessor. An object code of an assembler test program is supplied to the microprocessor. A memory test pattern is generated by the microprocessor based on the object code of the assembler test program. The memory test pattern is supplied to the embedded memory and the resultant response signal from the memory is evaluated by comparing it with reference values. Two Independent claims are included for a system of testing a memory embedded in an integrated circuit chip.