发明名称 METHOD FOR MAKING AN INTEGRATED CIRCUIT CONTAINING AN ALIGNMENT MARK AREA
摘要 <p>The invention concerns a method for making an integrated circuit which consists: in etching on a silicon substrate at least an alignment mark area provided with aligning grooves for a photorepeater; in depositing a boundary layer on the silicon substrate; in etching trenches designed to form insulating zones; then in depositing a silicon oxide layer on the circuit; and in etching the oxide layer over the whole alignment mark area.</p>
申请公布号 WO0022675(A1) 申请公布日期 2000.04.20
申请号 WO1999FR02482 申请日期 1999.10.13
申请人 STMICROELECTRONICS SA;FRANCE TELECOM;KONINKLIJKE PHILIPS ELECTRONICS N.V.;BOUTIN, DANIEL;INARD, ALAIN;BOLT, MICHAEL;LUCE, EMMANUELLE;BARLA, CATHY 发明人 BOUTIN, DANIEL;INARD, ALAIN;BOLT, MICHAEL;LUCE, EMMANUELLE;BARLA, CATHY
分类号 H01L23/544;(IPC1-7):H01L23/544;G03F9/00 主分类号 H01L23/544
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