发明名称 Semiconductor device fabrication using a sacrificial plug for defining a region for a gate electrode
摘要 A semiconductor device is formed by forming a sacrificial plug over a substrate and forming active regions in the substrate adjacent the sacrificial plug. A film is then formed over portions of the substrate adjacent the sacrificial plug. The sacrificial plug is then selectively removed leaving an opening in the film, and a gate electrode is formed in the opening. The sacrificial plug can be formed from several materials including, for example, polysilicon and nitrogen-bearing species such as nitride. The gate electrode may, for example, be formed from temperature-sensitive metals such as copper since the gate electrode may be formed subsequent to high temperature steps of the fabrication, such as a source drain anneal, for example.
申请公布号 US6051487(A) 申请公布日期 2000.04.18
申请号 US19970993612 申请日期 1997.12.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GARDNER, MARK I.;FULFORD, H. JIM;GILMER, MARK C.;PAIZ, ROBERT
分类号 H01L21/28;H01L21/336;H01L29/49;H01L29/51;(IPC1-7):H01L21/320 主分类号 H01L21/28
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