发明名称 METHOD FOR ETCHING THIN FLIM OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for etching a thin film is provided to improve the etch uniformity and remove remnants using an etch gas using the characteristic of an etch gas in a plasma etch equipment. CONSTITUTION: A method for etching a thin film forms an insulating film(22) on a semiconductor substrate(21). The insulating film(22) is selectively etched so that a given portion on the surface of the semiconductor substrate(21) can be exposed, thus forming a contact hole. A polysilicon layer is formed on the entire surface of the semiconductor substrate(21) including the contact hole. The polysilicon layer is firstly etched by a given thickness using an etch gas of Cl2+N3. The polysilicon layer is secondly etched using an etch gas in which O2 or Ar is added to SF3 so that it remains only within the contact hole, thus forming a plug(24a).
申请公布号 KR100252867(B1) 申请公布日期 2000.04.15
申请号 KR19970063356 申请日期 1997.11.27
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 KIM, HAN SOO
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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