发明名称 |
METHOD FOR ETCHING THIN FLIM OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for etching a thin film is provided to improve the etch uniformity and remove remnants using an etch gas using the characteristic of an etch gas in a plasma etch equipment. CONSTITUTION: A method for etching a thin film forms an insulating film(22) on a semiconductor substrate(21). The insulating film(22) is selectively etched so that a given portion on the surface of the semiconductor substrate(21) can be exposed, thus forming a contact hole. A polysilicon layer is formed on the entire surface of the semiconductor substrate(21) including the contact hole. The polysilicon layer is firstly etched by a given thickness using an etch gas of Cl2+N3. The polysilicon layer is secondly etched using an etch gas in which O2 or Ar is added to SF3 so that it remains only within the contact hole, thus forming a plug(24a).
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申请公布号 |
KR100252867(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19970063356 |
申请日期 |
1997.11.27 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
KIM, HAN SOO |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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