发明名称 METHOD FOR FORMING ACTIVE AREA OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming active area of semiconductor device is provided to enhance the reliability of the semiconductor device by easily ensuring an active area to minimize the failure rate. CONSTITUTION: A method for forming active area of semiconductor device comprises a step sequentially a nitration film(14) and an oxidation film(16) on a semiconductor substrate(10) having a bottom film(12) previously formed, and a step performing photoresist etching process in order to ensure an active area. The oxidation film is formed by thermal oxidation process, CVD(chemical vapor deposition) process or heat treatment process.
申请公布号 KR20000019930(A) 申请公布日期 2000.04.15
申请号 KR19980038288 申请日期 1998.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYUNG DONG;PARK, YEON SIK
分类号 H01L21/32;(IPC1-7):H01L21/32 主分类号 H01L21/32
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