发明名称 |
METHOD FOR FORMING ACTIVE AREA OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming active area of semiconductor device is provided to enhance the reliability of the semiconductor device by easily ensuring an active area to minimize the failure rate. CONSTITUTION: A method for forming active area of semiconductor device comprises a step sequentially a nitration film(14) and an oxidation film(16) on a semiconductor substrate(10) having a bottom film(12) previously formed, and a step performing photoresist etching process in order to ensure an active area. The oxidation film is formed by thermal oxidation process, CVD(chemical vapor deposition) process or heat treatment process.
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申请公布号 |
KR20000019930(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038288 |
申请日期 |
1998.09.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYUNG DONG;PARK, YEON SIK |
分类号 |
H01L21/32;(IPC1-7):H01L21/32 |
主分类号 |
H01L21/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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