发明名称 |
MANUFACTURING METHOD OF A TRANSISTOR FOR HIGH SPEED DEVICES |
摘要 |
PURPOSE: A method for manufacturing a transistor is to use a mask in formation of a deep implantation region in a P-well, thereby maintaining well concentration and reducing junction capacitance of source/drain. CONSTITUTION: A well region(2) is formed in a semiconductor substrate(1). A field oxide layer(3) is deposited on a portion of the semiconductor substrate to be formed of an isolation region. A photoresist pattern is formed to expose a portion to be a gate electrode for the entire structure. Impurities are implanted into the substrate to form a deep implantation region for threshold voltage using the photoresist pattern as a mask. A gate oxide layer is formed after the photoresist pattern is removed. A gate electrode is formed after a thin film for gate is deposited on the gate oxide layer. An LDD region(8) is formed in the well region using the gate electrode as a mask. A source/drain region is formed after a spacer oxide is formed on a sidewall of the gate electrode.
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申请公布号 |
KR100253562(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19920027082 |
申请日期 |
1992.12.31 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
YOON, JONG-SUB |
分类号 |
H01L29/78;H01L21/336;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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