| 摘要 |
PURPOSE: A device for testing semiconductor is provided to determine rapidly a state of a control bit board by performing a test program. CONSTITUTION: A device for testing semiconductor comprises a control bit board(10), a switching unit(20), a pull up unit, and a tester(40). The control bit board generates a plurality of control bit signal. The switching unit is switched according to the input control bit signals. The pull up unit is connected to the switching unit and pulled up to a power voltage level when switching the switching unit. The tester performs a predetermined test program, controls the control bit board to generate the control bit signals, detects the pulled up voltage, and determining a state of the control bit board by comparing the detected voltage to a predetermined voltage. |
