发明名称 |
CLEANING COMPOSITION FOR SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF SEMICONDUCTOR DEVICE USING SAID CLEANING COMPOSITION |
摘要 |
PURPOSE: A cleaning composition and a method for manufacturing semiconductor devices using the same are provided to have a good cleaning effect and to prevent consumption of a hemispheric silicon layer upon a cleaning process. CONSTITUTION: A cleaning composition comprises HF of 0.01 - 10 weight%, H2O2 of 1 - 10weight%, isopropyl alcohol(IPA) of 0.01 - 30 weight% and H2O of a small quantity. A method for manufacturing semiconductor devices using the cleaning composition forms an insulating film(12) on a semiconductor substrate(10). A contact hole is formed at a specific location of the insulating film(12). A polysilicon layer as the first conductive layer is formed on the entire surface. A storage electrode pattern(14') is formed by a conventional photolithography process. The insulating film(12) is under-cut so that a portion of the bottom of the storage electrode pattern(14') can be exposed. After a dielectric film of a capacitor is formed on the exposed surface of the storage electrode pattern(14'), an upper electrode of a capacitor is formed. A hemispheric silicon layer (HSG,16) is formed on the exposed surface of the storage electrode pattern(14').
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申请公布号 |
KR100253086(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19970035185 |
申请日期 |
1997.07.25 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
KIL, JOON-ING;JUN, PIL-KWON;YUN, MIN-SANG;YUN, YOUNG-HWAN;KWACK, GYU-HWAN;CHON, SANG-MOON |
分类号 |
H01L27/04;H01L21/02;H01L21/304;H01L21/306;H01L21/3213;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/304 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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