发明名称 CLEANING COMPOSITION FOR SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF SEMICONDUCTOR DEVICE USING SAID CLEANING COMPOSITION
摘要 PURPOSE: A cleaning composition and a method for manufacturing semiconductor devices using the same are provided to have a good cleaning effect and to prevent consumption of a hemispheric silicon layer upon a cleaning process. CONSTITUTION: A cleaning composition comprises HF of 0.01 - 10 weight%, H2O2 of 1 - 10weight%, isopropyl alcohol(IPA) of 0.01 - 30 weight% and H2O of a small quantity. A method for manufacturing semiconductor devices using the cleaning composition forms an insulating film(12) on a semiconductor substrate(10). A contact hole is formed at a specific location of the insulating film(12). A polysilicon layer as the first conductive layer is formed on the entire surface. A storage electrode pattern(14') is formed by a conventional photolithography process. The insulating film(12) is under-cut so that a portion of the bottom of the storage electrode pattern(14') can be exposed. After a dielectric film of a capacitor is formed on the exposed surface of the storage electrode pattern(14'), an upper electrode of a capacitor is formed. A hemispheric silicon layer (HSG,16) is formed on the exposed surface of the storage electrode pattern(14').
申请公布号 KR100253086(B1) 申请公布日期 2000.04.15
申请号 KR19970035185 申请日期 1997.07.25
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIL, JOON-ING;JUN, PIL-KWON;YUN, MIN-SANG;YUN, YOUNG-HWAN;KWACK, GYU-HWAN;CHON, SANG-MOON
分类号 H01L27/04;H01L21/02;H01L21/304;H01L21/306;H01L21/3213;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/304 主分类号 H01L27/04
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