发明名称 METHOD FOR ISOLATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for isolating a semiconductor device is provided to get a trench with a good profile without defects caused by the post wet processing and the process of removing a mask. CONSTITUTION: The side inferiority of a trench in removing a trench etch mask and in wet processing process is prevented by depositing a polycrystalline silicon(150) only on a side and a bottom of the trench and filling trench by oxidizing the polycrystalline silicon. The method comprises the steps of: forming the trench etch mask for isolation on a semiconductor substrate(110); forming the trench by etching the semiconductor substrate using the etch mask; depositing the polycrystalline silicon only on the side wall and the bottom of the trench; and filling the trench with the oxidized polycrystalline silicon after oxidizing the polycrystalline silicon.
申请公布号 KR20000020193(A) 申请公布日期 2000.04.15
申请号 KR19980038683 申请日期 1998.09.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KO, KYUNG KUN;LEE, KYUNG TAE
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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