发明名称 |
METHOD FOR ISOLATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for isolating a semiconductor device is provided to get a trench with a good profile without defects caused by the post wet processing and the process of removing a mask. CONSTITUTION: The side inferiority of a trench in removing a trench etch mask and in wet processing process is prevented by depositing a polycrystalline silicon(150) only on a side and a bottom of the trench and filling trench by oxidizing the polycrystalline silicon. The method comprises the steps of: forming the trench etch mask for isolation on a semiconductor substrate(110); forming the trench by etching the semiconductor substrate using the etch mask; depositing the polycrystalline silicon only on the side wall and the bottom of the trench; and filling the trench with the oxidized polycrystalline silicon after oxidizing the polycrystalline silicon.
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申请公布号 |
KR20000020193(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038683 |
申请日期 |
1998.09.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KO, KYUNG KUN;LEE, KYUNG TAE |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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地址 |
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