发明名称 PREPARATION METHOD OF SLURRY FOR POLISHING DIELECTRIC LAYER OF WAFER
摘要 PURPOSE: A preparation method of slurry is disclosed having an excellent polishing rate and a micro-scratch property in polishing a dielectric layer of a wafer. CONSTITUTION: A slurry is prepared from dispersing an ammonium salt in a silica polishingparticle. The silica is a fumed silica obtained by high-temperature oxidation method and has a mean particle size of 5 to 80 nanometer. The ammonium salt is used for controlling the particle size and includes alkyl trimethyl ammonium chloride or alkyl trimethyl ammonium bromide, where the alkyl group has a carbon number of C1 to C30. The addition amount of the ammonium salt is from 0.001 to 0.5 percent by weight relative to that of the silica.
申请公布号 KR20000019872(A) 申请公布日期 2000.04.15
申请号 KR19980038194 申请日期 1998.09.16
申请人 CHEIL INDUSTRIES INC. 发明人 LEE, GIL SEONG;LEE, JAE SEOK;KIM, SEOK JIN;JANG, DU WON
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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