发明名称 |
PREPARATION METHOD OF SLURRY FOR POLISHING DIELECTRIC LAYER OF WAFER |
摘要 |
PURPOSE: A preparation method of slurry is disclosed having an excellent polishing rate and a micro-scratch property in polishing a dielectric layer of a wafer. CONSTITUTION: A slurry is prepared from dispersing an ammonium salt in a silica polishingparticle. The silica is a fumed silica obtained by high-temperature oxidation method and has a mean particle size of 5 to 80 nanometer. The ammonium salt is used for controlling the particle size and includes alkyl trimethyl ammonium chloride or alkyl trimethyl ammonium bromide, where the alkyl group has a carbon number of C1 to C30. The addition amount of the ammonium salt is from 0.001 to 0.5 percent by weight relative to that of the silica.
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申请公布号 |
KR20000019872(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038194 |
申请日期 |
1998.09.16 |
申请人 |
CHEIL INDUSTRIES INC. |
发明人 |
LEE, GIL SEONG;LEE, JAE SEOK;KIM, SEOK JIN;JANG, DU WON |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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地址 |
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