发明名称 METHOD OF MANUFACTURING RAISED SOURCE/DRAIN OF TRANSISTOR
摘要 PURPOSE: A method of manufacturing raised source/drain of a transistor is provided to minimize an area of a substrate when applying silicide to shallow source/drain regions. CONSTITUTION: A method of manufacturing raised source/drain comprises the steps of: forming a gate electrode layer composed of sequentially multi-laying a gate electrode and a gate mask; forming a spacer on both side walls of the gate electrode layer; forming source/drain regions by injecting impurity ions into both sides of the gate spacer on a semiconductor substrate; forming a silicon epitaxial layer on the source/drain regions on both sides of the gate spacer; and silicidying all of the silicon epitaxial layer.
申请公布号 KR20000020330(A) 申请公布日期 2000.04.15
申请号 KR19980038891 申请日期 1998.09.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, U TAK
分类号 H01L21/24;(IPC1-7):H01L21/24 主分类号 H01L21/24
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