发明名称 |
PLASMA ETCHING EQUIPMENT FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A plasma etching equipment for manufacturing a semiconductor device is provided to prevent a uniformity from reducing. CONSTITUTION: A dry etching process using an etching gas of a plasma state is performed in an etching chamber(10). A plurality of electrodes are provided within the etching chamber. A start point(32) and an end point(34) of a coil(30) are located on same vertical line and spaced at predetermined interval. The coil is wound on the etching chamber. The coil indicate a sinewave curve. The coil has a diameter of 14mm to 18mm. The coil is wound on the inside wall or the outside wall of the etching chamber. The coil is wound once. Thereby, a uniform plasma is formed at the interior of the etching chamber, so that a lowering of the uniformity is prevented.
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申请公布号 |
KR20000020986(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980039874 |
申请日期 |
1998.09.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SEONG BAE;JI, YEON HONG;PARK, YUN SE |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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地址 |
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