发明名称 PLASMA ETCHING EQUIPMENT FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A plasma etching equipment for manufacturing a semiconductor device is provided to prevent a uniformity from reducing. CONSTITUTION: A dry etching process using an etching gas of a plasma state is performed in an etching chamber(10). A plurality of electrodes are provided within the etching chamber. A start point(32) and an end point(34) of a coil(30) are located on same vertical line and spaced at predetermined interval. The coil is wound on the etching chamber. The coil indicate a sinewave curve. The coil has a diameter of 14mm to 18mm. The coil is wound on the inside wall or the outside wall of the etching chamber. The coil is wound once. Thereby, a uniform plasma is formed at the interior of the etching chamber, so that a lowering of the uniformity is prevented.
申请公布号 KR20000020986(A) 申请公布日期 2000.04.15
申请号 KR19980039874 申请日期 1998.09.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SEONG BAE;JI, YEON HONG;PARK, YUN SE
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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