发明名称 |
METHOD OF FORMING METAL SILICIDE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming metal silicide is provided to form a metal silicide without a heat treatment. CONSTITUTION: A method of forming metal silicide comprises the steps of: forming an insulation layer(4) on a substrate(1) on which a semiconductor device is formed and forming a mask to expose a specific region of the semiconductor device by forming a contact hole in the insulation layer; and injecting accelerated metal ionized by applying a high voltage to the substrate(1) into the specific region of the exposed semiconductor device and evaporating a metal layer(2) on the insulation layer(4) and the side wall of the contact hole.
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申请公布号 |
KR20000020215(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038726 |
申请日期 |
1998.09.18 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, YEONG SU |
分类号 |
H01L21/24;(IPC1-7):H01L21/24 |
主分类号 |
H01L21/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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