发明名称 METHOD OF FORMING METAL SILICIDE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming metal silicide is provided to form a metal silicide without a heat treatment. CONSTITUTION: A method of forming metal silicide comprises the steps of: forming an insulation layer(4) on a substrate(1) on which a semiconductor device is formed and forming a mask to expose a specific region of the semiconductor device by forming a contact hole in the insulation layer; and injecting accelerated metal ionized by applying a high voltage to the substrate(1) into the specific region of the exposed semiconductor device and evaporating a metal layer(2) on the insulation layer(4) and the side wall of the contact hole.
申请公布号 KR20000020215(A) 申请公布日期 2000.04.15
申请号 KR19980038726 申请日期 1998.09.18
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, YEONG SU
分类号 H01L21/24;(IPC1-7):H01L21/24 主分类号 H01L21/24
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