发明名称 |
MONITORING SYSTEM OF SEMICONDUCTOR PROCESS EQUIPMENT |
摘要 |
PURPOSE: A system for monitoring semiconductor process facilities is provided to simplify wiring for the monitoring between a central monitoring device and many semiconductor process facilities. CONSTITUTION: A main selection signal line(L1) containing the first extension 'w' and the second extension 'x' and a main information transmission line(L2) containing the third extension 'y' and the fourth extension 'z' are connected to a central monitoring device(20). The main selection signal line(L1) and the main information transmission line(L2) are installed near to semiconductor process facilities(22-28). Each semiconductor process facilities(22-28) is connected to a sub selection signal line(L3) having a pair of extensions 'ws' and 'xs' and a sub information transmission line(L4) having a pair of extensions 'ys' and 'zs'.
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申请公布号 |
KR100253101(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19970079191 |
申请日期 |
1997.12.30 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
LIM, BYUNG KI |
分类号 |
H01L21/02;H01L21/00;H04N7/18;(IPC1-7):H04N7/18 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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