发明名称 |
CLEANING APPARATUS FOR SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: A semiconductor wafer cleaning apparatus is provided to reduce deformation of a pattern dimension and the surface roughness, and to improve a particle removal capability by reducing the amount of etch of a wafer using bubbles from a gas spray hole. CONSTITUTION: A semiconductor wafer cleaning apparatus includes a cleaning bath(11) onto which a wafer cassette(15) on which a wafer(16) is mounted is loaded. A plurality of outside gas supply tubes(17) provide a gas from the outside to the inside of the cleaning bath(11). A fluid solution supply tube(12) has an inlet(13) for introducing a cleaning solution used in a cleaning process at the bottom of one side of the cleaning bath(11). A supply amount sensor(14) is provided on the upper side of the fluid solution supply tube(12). An internal gas supply tubes(18) has a plurality of bubble spray holes(19). The bubble spray holes(19) are vertically installed on the same position to the outside gas supply tubes(17), within the cleaning bath(16), and spray a gas of the outside gas supply tubes(17).
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申请公布号 |
KR100252865(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19970063821 |
申请日期 |
1997.11.28 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
PARK, JAE-WOO |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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