MICRO CONTROLLER FOR REDUCING TEST TIME OF RAM

摘要

PURPOSE: A circuit diagram of a micro controller is provided to reduce a test time of a RAM. CONSTITUTION: A RAM(180) stores a program for operating a micro controller, and ROM(120) stores data and a program while the micro controller operates. A first selector selectively outputs a command and a program inputted from the first memory in response to a test signal. A control circuit(160) responds to a command inputted from the first selector to output a control signal, an address and the data. A second selector outputs the control signal, the address and the data to the second memory in response to the select signal.