发明名称 Large diameter, high temperature stable, single crystal semiconductor substrate wafer, for IC production, has an anti-stress layer outside the active region to counteract gravity-induced forces
摘要 A large diameter, high temperature stable, single crystal semiconductor substrate wafer (1) has an anti-stress layer (3) outside the active region to counteract gravity-induced forces. A single crystal semiconductor substrate wafer, of /- 200 mm diameter, has one or more single crystal and/or amorphous anti-stress layers (3) which counteract mechanical forces acting on the bulk material during a high temperature process during device production, layer(s) arranged outside the active regions and dimensioned according to gravity-induced compressive, bending and friction forces resulting from the bulk material and the horizontal lay-out scheme in batch or single wafer processing. An Independent claim is also included for production of the above wafer. Preferred Features: The anti-stress layer is a buried silicon-germanium layer or a back face silicon nitride layer.
申请公布号 DE19848298(A1) 申请公布日期 2000.04.13
申请号 DE19981048298 申请日期 1998.10.12
申请人 INSTITUT FUER HALBLEITERPHYSIK FRANKFURT (ODER) GMBH 发明人 HOLLAENDER, FRANK;KNOLL, DIETER;KUCK, BEATE;FISCHER, ARMIN;RICHTER, HANS;TILLACK, BERND;OSTEN, JOERG
分类号 H01L21/20;H01L21/205;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):H01L21/20;C30B23/02;C30B25/02 主分类号 H01L21/20
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