发明名称 |
Large diameter, high temperature stable, single crystal semiconductor substrate wafer, for IC production, has an anti-stress layer outside the active region to counteract gravity-induced forces |
摘要 |
A large diameter, high temperature stable, single crystal semiconductor substrate wafer (1) has an anti-stress layer (3) outside the active region to counteract gravity-induced forces. A single crystal semiconductor substrate wafer, of /- 200 mm diameter, has one or more single crystal and/or amorphous anti-stress layers (3) which counteract mechanical forces acting on the bulk material during a high temperature process during device production, layer(s) arranged outside the active regions and dimensioned according to gravity-induced compressive, bending and friction forces resulting from the bulk material and the horizontal lay-out scheme in batch or single wafer processing. An Independent claim is also included for production of the above wafer. Preferred Features: The anti-stress layer is a buried silicon-germanium layer or a back face silicon nitride layer.
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申请公布号 |
DE19848298(A1) |
申请公布日期 |
2000.04.13 |
申请号 |
DE19981048298 |
申请日期 |
1998.10.12 |
申请人 |
INSTITUT FUER HALBLEITERPHYSIK FRANKFURT (ODER) GMBH |
发明人 |
HOLLAENDER, FRANK;KNOLL, DIETER;KUCK, BEATE;FISCHER, ARMIN;RICHTER, HANS;TILLACK, BERND;OSTEN, JOERG |
分类号 |
H01L21/20;H01L21/205;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):H01L21/20;C30B23/02;C30B25/02 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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