| 摘要 |
<p>A system for scanning an X-ray target (50) in an X-ray imaging system with a charged particle beam (40) is disclosed. According to an embodiment, the invention comprises deflecting the charged particle beam to re-illuminate the portion of the object (100) to be imaged in a time period that is sufficiently small to prevent blurring during image reconstruction. A scan processing system for processing X-ray transmissiveness information received as a result of a scanning pattern that re-illuminates an object is disclosed.</p> |
