| 摘要 |
The present invention relates to a testing device for detecting and determining material inhomogeneities in electrically conductive samples (10), comprising a support (30) for the samples(10) to be tested, a temperature regulating device (30, 50, 60) for configuring a temperature profile in the sample (10), a drive connected to the support (30) for changing the position of the sample (10) and at least one measuring sensor (20) for contactless measurement of the magnetic field outside the sample (10).
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