发明名称 WAFER-CARRIER DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To prevent the breakage and contamination of a wafer by preventing the attachment and fixing of contamination at a holding part in the wafer- carrier device, which is mounted on a polishing device and the like of the semiconductor wafer and the like, sucks and holds the wafer at a holding part comprising a porous member and the like and carries the wafer. SOLUTION: This device has a vacuum source 43, which applies sucking action to a holding part, a mixing part 44, wherein air and water are mixed, an air supply source part 46, which supplies air into the mixing part 44, and a water-supply source 45, which supplies the water into the mixing part 44. Then, the vacuum source 44 is connected to the holding part through a first opening/closing means 41. The air supply source 46 and the water supply source 45 are connected to the mixing part 44. The mixing part 44 constitutes the wafer-carrier device, which is connected to the holding part through a second opening/closing means 42. When the wafer is opened, the bubbles wherein the water and the air are mixed, are blown out.</p>
申请公布号 JP2000106390(A) 申请公布日期 2000.04.11
申请号 JP19980275067 申请日期 1998.09.29
申请人 DISCO ABRASIVE SYST LTD 发明人 TANAKA KENZO
分类号 H01L21/677;B25J15/06;H01L21/304;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/677
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