| 摘要 |
PCT No. PCT/FR96/00541 Sec. 371 Date Sep. 30, 1997 Sec. 102(e) Date Sep. 30, 1997 PCT Filed Apr. 10, 1996 PCT Pub. No. WO96/33461 PCT Pub. Date Oct. 24, 1996A method of automatically testing electronic components in parallel, identical pins (+E,uns i+EE ; i+1) of said components interchanging test signals with at least one common test circuit (20; 20') which includes, firstly, timing generators (22a, 22b, 22c, 22d; 22'a, 22'b, 22'c, 22'd) controlled by a test programming memory (10) and, secondly, forcing circuits (241, 242; 24'1, 24'2) and comparator circuits (261, 262; 26'1, 26'2) controlled by said timing generators. In accordance with the invention, all the timing generators are assigned to said forcing circuits or to said comparator circuits in such manner as to produce synchronous test signals at said identical pins (+E,uns i+EE ) of said electronic components. Applications include automatic testing of components in parallel.
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