发明名称 Methods using a data read latch circuit in a semiconductor device
摘要 A method and circuit for self-latching data read lines that are used to transfer data that is read from a memory array of a memory device to a data output register of the memory device, wherein a self-latching latch circuit is connected to each data read line The latch circuits are located physically near the output of the memory array, for latching data that is read from the memory array as soon as the data is applied to the data read lines, and prior to the data being latched in the data output register, thereby minimizing the effects of propagation delay so that the memory cycle time can be decreased. In one embodiment wherein the memory is organized in a "x4" configuration, different groups of the data read lines are selected in alternate read cycles, and the data read lines of the non-selected data read group are equilibrated automatically during the read cycle using the conventional test circuits of the memory device.
申请公布号 US6049489(A) 申请公布日期 2000.04.11
申请号 US19990374663 申请日期 1999.08.16
申请人 MICRON TECHNOLOGY, INC. 发明人 MERRITT, TODD A.
分类号 G11C7/10;G11C29/12;G11C29/48;(IPC1-7):G11C8/00 主分类号 G11C7/10
代理机构 代理人
主权项
地址