| 摘要 |
PROBLEM TO BE SOLVED: To increase the number of ICs with multipin under test at the same time without enlarging a hardware. SOLUTION: In this IC testing device, each unit provided on every pin is provided with a first switching circuit 21, a second switching circuit 22 and a switching control device 23, a test pattern signal given to an IC under test is time-shared by the first switching circuit 21 to be given to plural ICs, in the second switching circuit, response output signals from plural ICs are selectively input to a logic comparator, and plural ICs are operated with time difference to double the number of ICs under test at the same time.
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