发明名称 Benign method for etching silicon dioxide
摘要 Traditionally, hydrofluoric acid (HF) or buffered bydrofluoric acid (NH4F) is mixed with water to form a etching solution for cleaning silicon dioxide from semiconductor wafer surfaces. An etching solution formed by mixing ammonium hydrogen bifluoride ((NH4)HF2) with water provides a benign alternative for cleaning silicon dioxide.
申请公布号 US6048406(A) 申请公布日期 2000.04.11
申请号 US19980057358 申请日期 1998.04.08
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MISRA, ASHUTOSH;PRASAD, JAGDISH;SEES, JENNIFER A.;HALL, LINDSEY H.
分类号 H01L21/306;H01L21/311;(IPC1-7):C23F1/00 主分类号 H01L21/306
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