发明名称 Universal printed circuit board inspection apparatus, and method of using same
摘要 An inspection apparatus for determining conductivity between and among inspection points on a printed circuit board. The apparatus comprises a plurality of probes arranged in a predetermined pattern, a translator board including a first set of terminals arranged in the same pattern as that of the probes and a second set of terminals arranged in the same pattern as that of the inspection points on a printed circuit board to be inspected, the first set of terminals being respectively interconnected with corresponding terminals of the second set, the translator board being exchangeably mounted in the apparatus, and interconnecting pins for electrically interconnecting the probes with corresponding terminals of the first set of terminals on the translator board.
申请公布号 US6049214(A) 申请公布日期 2000.04.11
申请号 US19970985848 申请日期 1997.12.05
申请人 NIDEC-READ CORPORATION 发明人 NISHIKAWA, HIDEO;MIKI, TAKASHI
分类号 G01R31/02;G01R1/073;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址