发明名称 FORMATION OF TRENCH ISOLATION
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of modified trench isolation capable of releasing the electric field at corner part. SOLUTION: Spacers 5 are formed on the sidewall of the aperture of a nitride film mask 3. Next, the surface of a semiconductor substrate 1 is etched away using this nitride film mask 3 thereby forming a trench 6 reflecting the shape of the spacers 5 on the surface of the semiconductor substrate 1. Finally, an oxide film is buried in the trench 6.
申请公布号 JP2000100929(A) 申请公布日期 2000.04.07
申请号 JP19980267805 申请日期 1998.09.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 ODA SHUICHI;KITAZAWA MASASHI;KUROI TAKASHI
分类号 H01L21/76;H01L21/8242;H01L27/108 主分类号 H01L21/76
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