| 摘要 |
PROBLEM TO BE SOLVED: To obtain an AC measuring circuit capable of performing AC measurement for any device input pin and device output pin of an LSI device with the function of boundary scan tests independently of the circuit between an internal flip-flop and flip-flop. SOLUTION: An LSI device with a function of boundary scan tests is provided with both an interface circuit 1-1 between an internal circuit 1-5 and a boundary scan register 1-4 and a control circuit 1-2 to receive a signal obtained by decoding a personal command for executing AC measurement on device input pins and device output pins by a command decoder and to output a control signal. By this, it is possible to observe from the device input pins to a first-stage flop-flop and from a final-stage flip-flop to the device output pins. |
